Resonant inelastic X-ray scattering
Advanced X-ray spectroscopy technique / From Wikipedia, the free encyclopedia
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Resonant inelastic X-ray scattering (RIXS) is an advanced X-ray spectroscopy technique.[1][2]
In the last two decades RIXS has been widely exploited to study the electronic, magnetic and structural properties of quantum materials and molecules. It is a resonant X-rays photon-in photon-out energy loss and momentum resolved spectroscopy, capable of measuring the energy and momentum transferred to specific excitations proper of the sample under study.[1][2]
The use of X-rays guarantees bulk sensitivity, as opposed to electron spectroscopies, and the tuning of the incoming X-rays to a specific absorption edge allows for element and chemical specificity.[1][2][3]
Due to the intrinsic inefficiency of the RIXS process, extremely brilliant sources of X-rays are crucial. In addition to that, the possibility to tune the energy of the incoming X-rays is compelling to match a chosen resonance. These two strict conditions make RIXS to be necessarily performed at synchrotrons or nowadays at X-ray free electron lasers (XFELs) and set the advent of third generation synchrotrons (1994, ESRF[4]) as a turning point for the success of the technique.[1][2]
Exploiting different experimental setups, RIXS can be performed using both soft and hard X-rays, spanning a vast range of absorption edges and thus samples to be studied.[1]